FISCHERSCOPE® X-RAY XAN®

Lorelei Ipsum Lorelei IpsumLorelei Ipsum Lorelei IpsumLorelei Ipsum Lorelei Ipsum

The system for a wide range of applications.

Universal instrument for metal and precious metal analysis as well as coating thickness measurement on simple shaped samples and RoHS screening.

 

Various measuring table options:
Fixed or manual
RoHS analysis:
Reliable determination of hazardous substances
Video microscope for convenient
determination of the optimal measuring point

The right XRF device for every application.

Whether PIN detector, silicon drift detector, fixed sample support or manually operated XY-table: The FISCHERSCOPE® X-RAY XAN® offers versatile applications and is adapted to your needs. This enables precise material analysis of precious metal and gold alloys, coating thickness measurement or trace analysis. The instrument version with the 50 mm² silicon drift detector is also suitable for RoHS measuring.

Versatile.

For trade, industry and laboratory applications

Quick-measure design.

The sample is placed and ready for measurement in just a few steps

Commissioning.

Extremely fast and simple

RoHS analysis.

Reliable determination of hazardous substances

DPP+ digital pulse processor*.

Even shorter measuring times with the same standard deviation**

*not with FISCHERSCOPE® X-RAY XAN® 215
*compared to the DPP

  • Features

      Microfocus tube with tungsten anode

      Silicon PIN and silicon drift detectors provide very good detection accuracy and high resolution

      Higher count rates and significantly reduced measurement times thanks to DPP+

      Larger hood: From 90 up to 170 mm possible height of samples, depending on device

      Apertures: fixed or 4-fold changeable*
      Primary filters: fixed or 6-fold changeable*
      *depending on device

      Type approved full protection device

      Smallest measuring spot approx.: Ø 0.3 mm

      Determination of metal content in electroplating baths with corresponding accessories

  • Application examples

      • Non-destructive analysis of dental alloys
      • Multilayer coatings
      • Analysis of functional layers from 10 nm in the electronics and semiconductor industry
      • Trace analyses for consumer protection, such as lead content in toys
      • Metal alloy determination with highest accuracy requirements in the jewelry industry and refineries

      Do you have further applications? Then contact us!

Application Notes
Product videos
Tutorials
Webinars
Brochures
FISCHERSCOPE® X-RAY XAN® 250: Introduction
FISCHERSCOPE® X-RAY XAN® 252: Introduction
FISCHERSCOPE® X-RAY: Calibration of X-ray measuring instruments
FISCHERSCOPE® X-RAY tutorial: Stability test
FISCHERSCOPE® X-RAY tutorial part 1: Export / Import products in WinFTM®
FISCHERSCOPE® X-RAY tutorial part 2: Export / Import products in WinFTM®
Setting up measurement equipment monitoring
ZnNi-Fe coating: Measurement of coating, as well as control of the associated baths
Report documentation

Fischer Insights.

Measuring method.

Learn and discover how the X-ray fluorescence analysis works.

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