可攜式測量儀器

可攜式測量儀器配有整合式或可更換的探頭,可直接在工件上測量塗層厚度。

桌上型測量儀器

透過可更換的測量探頭或 X 射線螢光探頭,進行固定塗層厚度測量的高性能桌面儀器。

接觸式儀器探頭

用於各種幾何形狀、塗層以及基板的高準確、堅固的探頭。

手冊 下載
接觸式儀器探頭 Brochure Probes [PDF]

校準與配件

搭配 Fischer 測量儀器使用的校準標準、儀表支架、軟體和配件,適用於塗鍍層厚度測量、材料分析、材料測試和奈米壓痕。

手冊 下載
DataCenter、DataCenter IP Brochure Datacenter [PDF]
技術參數表 下載
校準 TDS X-RAY Calibration Standards [PDF]
TR-Characterization of Cd primary and secondary reference materials [PDF]
TR-Characterization of Cr/Cu, Cr/CuSn and Cr/Fe reference materials [PDF]
TR-Characterization of Cr/Ni reference material [PDF]
TR-Characterization of Cu primary and secondary reference materials [PDF]
TR-Characterization of self-supporting Au foils and Au layers on mylar [PDF]
TR-On the Re-calibration of Au-Layer Master Reference Standards [PDF]
TR-On the re-calibration of Ni-foil reference standards [PDF]
TR-On the re-calibration of Pt-foil and Pt/Si Reference Standards [PDF]
TR-Primary reference standards for precious metal analysis (gold alloys) [PDF]
TR-On the re-calibration of Rh-foil reference standards [PDF]
TR-Re-calibration and characterization of Ti secondary reference standards [PDF]
TR-Re-calibration of self-supporting Cr foils with Cr/Fe reference standards [PDF]
TR-Re-check of Sn foils, self-supporting and mounted over Ni [PDF]
TR-Re-evaluation of Cr/Cu reference standards [PDF]
TR-Re-evaluation of Cr/Fe reference standards [PDF]
TR-Recertification of Au on Pd on Ni master standard foils [PDF]
TR-Recertification of master standards with Pd layers [PDF]
TR-Recertification of Zn and Zn/Fe secondary (“master”) reference standards [PDF]
TR-Traceability of mass per unit area and composition of ZnNi-coatings [PDF]
TR-Traceability of the amount of Phosphorus in NiP-coatings [PDF]

您的 FISCHER 聯絡人

Contact

菲希爾測試儀器有限公司/臺灣
臺北市/臺灣

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電話: +886 (2) 8797 5589
電子郵件: taiwan@helmutfischer.com
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